“FZU leads the NextBase Work Package 8 Characterization and numerical simulations. In particular FZU will develop methods for thickness profiling of thin films/comb-like finger shapes deposited on rough silicon substrate. This will be done by a new method based on Raman micro-spectroscopy…” Read more
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This project has received funding from the European Union’s Horizon2020 Programme for research, technological development and demonstration under Grant Agreement no. 727523.
